Open AccessOblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials
Author(s) -
Thomas W. Oates,
Babak Dastmalchi,
Goran Isić,
Sajjad Tollabimazraehno,
Christian Helgert,
Thomas Pertsch,
ErnstBernhard Kley,
Marc A. Verschuuren,
Iris Bergmair,
Kurt Hingerl,
Karsten Hinrichs
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.011166
Subject(s) - metamaterial , optics , materials science , ellipsometry , transmittance , nanoimprint lithography , polarization (electrochemistry) , refractive index , characterization (materials science) , polarizer , dispersion (optics) , rigorous coupled wave analysis , optoelectronics , thin film , grating , diffraction grating , birefringence , physics , nanotechnology , fabrication , medicine , chemistry , alternative medicine , pathology
We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood's anomalies. The lack of angular dispersion of the anti-symmetric gap-modes does not agree with the model and requires further theoretical investigation.