Open AccessNumerical retrieval of thin aluminium layer properties from SPR experimental data
Author(s) -
Dominique Barchiesi
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.009064
Subject(s) - materials science , aluminium , optics , surface plasmon resonance , reflection coefficient , refractive index , layer (electronics) , thin film , polarization (electrochemistry) , surface plasmon , inverse , composite material , optoelectronics , plasmon , nanotechnology , physics , chemistry , nanoparticle , geometry , mathematics
The inverse problem for Surface Plasmon Resonance measurements [1] on a thin layer of aluminium in the Kretschmann configuration, is solved with a Particle Swarm Optimization method. The optical indexes as well as the geometrical parameters are found for the best fit of the experimental reflection coefficient in s and p polarization, for four samples, under three theoretical hypothesis on materials: the metal layer is pure, melted with its oxyde, or coated with oxyde. The influence of the thickness of the metal layer on its optical properties is then investigated.