Open AccessAbsolute distance measurement with micrometer accuracy using a Michelson interferometer and the iterative synthetic wavelength principle
Author(s) -
Khaled M. Alzahrani,
David R. Burton,
Francis Lilley,
Munther Gdeisat,
Frédéric Bezombes,
Mohammad Qudeisat
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.005658
Subject(s) - optics , michelson interferometer , interferometry , wavelength , fourier transform , micrometer , measure (data warehouse) , laser , triangulation , computer science , physics , mathematics , geometry , quantum mechanics , database
We present a novel system that can measure absolute distances of up to 300 mm with an uncertainty of the order of one micrometer, within a timeframe of 40 seconds. The proposed system uses a Michelson interferometer, a tunable laser, a wavelength meter and a computer for analysis. The principle of synthetic wave creation is used in a novel way in that the system employs an initial low precision estimate of the distance, obtained using a triangulation, or time-of-flight, laser system, or similar, and then iterates through a sequence of progressively smaller synthetic wavelengths until it reaches micrometer uncertainties in the determination of the distance. A further novel feature of the system is its use of Fourier transform phase analysis techniques to achieve sub-wavelength accuracy. This method has the major advantages of being relatively simple to realize, offering demonstrated high relative precisions better than 5 × 10(-5). Finally, the fact that this device does not require a continuous line-of-sight to the target as is the case with other configurations offers significant advantages.