
Raman concentrators in Ge nanowires with dielectric coatings
Author(s) -
Jerome K. Hyun,
In Soo Kim,
Justin G. Connell,
Lincoln J. Lauhon
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.005127
Subject(s) - nanowire , raman spectroscopy , materials science , raman scattering , dielectric , optics , coating , nanostructure , optoelectronics , signal (programming language) , nanotechnology , physics , computer science , programming language
Raman spectroscopy is a powerful tool for investigating many fundamental properties of nanostructures, but extrinsic effects including background scattering and laser-induced heating can limit the analysis of intrinsic properties. A thin SiO2 dielectric coating is found to enhance the Raman signal from a single Ge nanowire by a factor of two as a result of wave interference. Consequently, the coated nanowire experiences less heating than a bare nanowire at equivalent signal intensities. The results demonstrate a simple and effective method to extend the limits of Raman analysis on single nanostructures and facilitate their characterization.