Open AccessOptical features of a LiF crystal soft x-ray imaging detector irradiated by free electron laser pulses
Author(s) -
T. A. Pikuz,
A. Ya. Faenov,
Yuji Fukuda,
M. Kando,
P. R. Bolton,
A. V. Mitrofanov,
А. В. Виноградов,
Mitsuru Nagasono,
Haruhiko Ohashi,
Makina Yabashi,
Kensuke Tono,
Yasunori Senba,
Tadashi Togashi,
Tetsuya Ishikawa
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.003424
Subject(s) - photoluminescence , materials science , laser , optics , femtosecond , irradiation , fluence , crystal (programming language) , spectral line , optoelectronics , physics , astronomy , computer science , nuclear physics , programming language
Optical features of point defects photoluminescence in LiF crystals, irradiated by soft X-ray pulses of the Free Electron Laser with wavelengths of 17.2 - 61.5 nm, were measured. We found that peak of photoluminescence spectra lies near of 530 nm and are associated with emission of F3+ centers. Our results suggest that redistribution of photoluminescence peak intensity from the red to the green part of the spectra is associated with a shortening of the applied laser pulses down to pico - or femtosecond durations. Dependence of peak intensity of photoluminescence spectra from the soft X-ray irradiation fluence was measured and the absence of quenching phenomena, even at relatively high fluencies was found, which is very important for wide applications of LiF crystal X-ray imaging detectors.