Open AccessMeasurement of the transverse electric field profile of light by a self-referencing method with direct phase determination
Author(s) -
C. Bamber,
Brandon Sutherland,
Ajay I. Patel,
Corey Stewart,
Jeff S. Lundeen
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.002034
Subject(s) - optics , electric field , transverse plane , wavefront , light beam , physics , normalization (sociology) , phase (matter) , light field , structural engineering , quantum mechanics , sociology , anthropology , engineering
We present a method for measuring the transverse electric field profile of a beam of light which allows for direct phase retrieval. The measured values correspond, within a normalization constant, to the real and imaginary parts of the electric field in a plane normal to the direction of propagation. This technique represents a self-referencing method for probing the wavefront characteristics of light.