Open AccessPhotosensitivity and stress changes of Ge-free Bi-Al doped silica optical fibers under ArF excimer laser irradiation
Author(s) -
Christian Ban,
H.G. Limberger,
Valery M. Mashinsky,
E. M. Dianov
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.026859
Subject(s) - materials science , photosensitivity , excimer laser , irradiation , optical fiber , fiber , refractive index , optics , bismuth , all silica fiber , hard clad silica optical fiber , laser , fiber laser , fiber bragg grating , doping , excimer , optoelectronics , dispersion shifted fiber , composite material , fiber optic sensor , wavelength , physics , nuclear physics , metallurgy
The photosensitivity of germanium free Bi-Al-doped silica fibers with different bismuth concentrations was investigated using ArF excimer laser radiation at 193 nm and fiber grating formation. For the fiber with the highest bismuth concentration maximum refractive index changes of 2.2 × 10(-3) and 2.0 × 10(-4) were obtained for hydrogen loaded and unloaded fibers, respectively. Irradiation induced tensile stress changes were observed in the fiber core of H(2)-loaded and unloaded fibers. The results indicate a contribution of compaction to the total refractive index change in both cases.