Open AccessSensitive voltage interrogation method using electro-optically tunable SPR sensors
Author(s) -
Zhiyou Wang,
Zheng Zhang,
Kun Wang,
Yalin Su,
Lei Liu,
Lusheng Song,
Yusheng Bian,
Rui Hou,
Shaopeng Li,
Jinsong Zhu
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.026651
Subject(s) - photodetector , materials science , voltage , optics , refractive index , surface plasmon resonance , analyte , optoelectronics , signal (programming language) , resonance (particle physics) , waveguide , interrogation , physics , chemistry , computer science , nanotechnology , particle physics , quantum mechanics , nanoparticle , programming language , archaeology , history
A novel voltage interrogation method using electro-optically tunable waveguide-coupled surface plasmon resonance sensors is demonstrated. Before measurements, we use a bicell photodetector to detect the reflectance from the sensor and take the differential signal from the photodetector as the resonance condition. For different analytes, by scanning the DC voltage on the waveguide layer of the sensor chip, the resonance condition can be maintained the same. Under this condition, we record the values of this voltage, namely the resonant voltage. Theoretical calculations and experimental results show the resonant voltage has a highly linear and sensitive response to analyte's refractive index. This method is simple in configuration, and complicated signal processing algorithms can be avoided.