Open AccessSurface plasmon leakage radiation microscopy at the diffraction limit
Author(s) -
Andreas Hohenau,
Joachim R. Krenn,
Aurélien Drezet,
Oriane Mollet,
S. Huant,
Cyriaque Genet,
Benedikt Stein,
Thomas W. Ebbesen
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.025749
Subject(s) - optics , surface plasmon polariton , diffraction , surface plasmon , microscopy , materials science , plasmon , image resolution , radiation , physics
This paper describes the image formation process in optical leakage radiation microscopy of surface plasmon-polaritons with diffraction limited spatial resolution. The comparison of experimentally recorded images with simulations of point-like surface plasmon-polariton emitters allows for an assignment of the observed fringe patterns. A simple formula for the prediction of the fringe periodicity is presented and practically relevant effects of abberations in the imaging system are discussed.