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A tilted grating interferometer for full vector field differential x-ray phase contrast tomography
Author(s) -
Simon Rutishauser,
Tilman Donath,
Christian Dávid,
Franz Pfeiffer,
Federica Marone,
Peter Modregger
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.024890
Subject(s) - optics , physics , grating , interferometry , phase contrast imaging , synchrotron radiation , tomography , x ray optics , tilt (camera) , phase (matter) , x ray , geometry , phase contrast microscopy , mathematics , quantum mechanics
We report on a setup for differential x-ray phase-contrast imaging and tomography, that measures the full 2D phase-gradient information. The setup uses a simple one-dimensional x-ray grating interferometer, in which the grating structures of the interferometer are oriented at a tilt angle with respect to the sample rotation axis. In such a configuration, the differential phase images from opposing tomography projections can be combined to yield both components of the gradient vector. We show how the refractive index distribution as well as its x, y, and z gradient components can be reconstructed directly from the recorded projection data. The method can equally well be applied at conventional x-ray tube sources, to analyzer based x-ray imaging or neutron imaging. It is demonstrated with measurements of an x-ray phantom and a rat brain using synchrotron radiation.

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