Open AccessFringe projection profilometry based on a novel phase shift method
Author(s) -
Yanjun Fu,
Qinghua Luo
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.021739
Subject(s) - structured light 3d scanner , profilometer , optics , projection (relational algebra) , grating , phase (matter) , phase retrieval , oblique projection , observational error , computer science , orthographic projection , physics , artificial intelligence , materials science , algorithm , mathematics , surface finish , fourier transform , scanner , statistics , quantum mechanics , composite material
Fringe projection profilometry is generally used to measure the 3D shape of an object. In oblique-angle projection, the grating fringe cycle is broadened on the reference surface. A well-fitted, convenient, and quick cycle correction method is proposed in this study. Based on the proposed method, an accurate four-step phase shift method is developed. Comparative experiments show that the fringe projection profilometry based on the novel phase shift method can eliminate cycle error and significantly improve measurement accuracy. The relative error of the measurement is less than 1.5%. This method can be widely employed for measuring large objects.