Open AccessThickness determination of graphene on metal substrate by reflection spectroscopy
Author(s) -
Tommi Kaplas,
A. A. Zolotukhin,
Yuri Svirko
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.017226
Subject(s) - graphene , materials science , refractive index , absorbance , optics , substrate (aquarium) , reflection (computer programming) , copper , metal , spectroscopy , optoelectronics , reflection coefficient , fresnel equations , nanotechnology , oceanography , physics , quantum mechanics , geology , computer science , metallurgy , programming language
We show that reflectivity measurements enable the determination of the thickness of multilayered graphene on a metal substrate. The developed technique is based on comparison of the substrate reflectance with and without graphene and relies on the strong absorbance of graphene and high refractive index contrast. We demonstrate the technique by measuring the thickness of the CVD graphene film grown on a copper substrate.