Open AccessMeasurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb
Author(s) -
Mehmetcan Akbulut,
Josue Davila-Rodriguez,
İbrahim Özdür,
Franklyn Quinlan,
Sarper Özharar,
Nazanin Hoghooghi,
Peter J. Delfyett
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.016851
Subject(s) - fabry–pérot interferometer , optics , frequency comb , materials science , heterodyne (poetry) , offset (computer science) , optical frequency comb , heterodyne detection , semiconductor , frequency offset , envelope (radar) , optoelectronics , laser , physics , telecommunications , acoustics , orthogonal frequency division multiplexing , channel (broadcasting) , computer science , programming language , radar
We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be ~1.47 GHz for the particular etalon that was used.