Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb | Zendy

M. Akbulut | Zendy; Josue Davila-Rodriguez | Zendy; İbrahim Özdür | Zendy; Franklyn Quinlan | Zendy; Sarper Özharar | Zendy; Nazanin Hoghooghi | Zendy; Peter J. Delfyett | Zendy

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Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb

Author(s) -

M. Akbulut,

Josue Davila-Rodriguez,

İbrahim Özdür,

Franklyn Quinlan,

Sarper Özharar,

Nazanin Hoghooghi,

Peter J. Delfyett

Publication year - 2011

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.19.016851

Subject(s) - fabry–pérot interferometer , optics , frequency comb , materials science , heterodyne (poetry) , offset (computer science) , optical frequency comb , heterodyne detection , semiconductor , frequency offset , envelope (radar) , optoelectronics , laser , physics , telecommunications , acoustics , orthogonal frequency division multiplexing , channel (broadcasting) , computer science , programming language , radar

We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be ~1.47 GHz for the particular etalon that was used.

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