Open AccessOptical characterization of a SCISSOR device
Author(s) -
Mattia Mancinelli,
R. Guider,
Marco Masi,
Paolo Bettotti,
M. R. Vanacharla,
Jean-Marc Fédéli,
L. Pavesi
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.013664
Subject(s) - resonator , silicon on insulator , optics , materials science , wafer , optoelectronics , silicon , fabrication , refractive index , coupled mode theory , photonics , physics , medicine , alternative medicine , pathology
Here, we report on the design, fabrication and characterization of single-channel (SC-) and dual-channel (DC-) side-coupled integrated spaced sequences of optical resonators (SCISSOR) with a finite number (eight) of microring resonators using submicron silicon photonic wires on a silicon-on-insulator (SOI) wafer. We present results on the observation of multiple resonances in the through and the drop port signals of DC-SCISSOR. These result from the coupled resonator induced transparency (CRIT) which appears when the resonator band (RB) and the Bragg band (BB) are nearly coincident. We also observe the formation of high-Q (> 23000) quasi-localized modes in the RB of the drop transmission which appear when the RB and BB are well separated from each other. These multiple resonances and quasi-localized modes are induced by nanometer-scale structural disorders in the dimension of one or more rings. Finally, we demonstrate the tunability of RB (and BB) and localized modes in the DC-SCISSOR by thermo-optical or free-carrier refraction.