Quantitative analysis and measurements of near-field interactions in terahertz microscopes | Zendy

Kiwon Moon | Zendy; Euna Jung | Zendy; Meehyun Lim | Zendy; Youngwoong Do | Zendy; Haewook Han | Zendy

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Quantitative analysis and measurements of near-field interactions in terahertz microscopes

Author(s) -

Kiwon Moon,

Euna Jung,

Meehyun Lim,

Youngwoong Do,

Haewook Han

Publication year - 2011

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.19.011539

Subject(s) - terahertz radiation , optics , microscope , near field scanning optical microscope , terahertz spectroscopy and technology , scattering , materials science , microscopy , optical microscope , near and far field , near field optics , physics , scanning electron microscope

We demonstrated quantitative analysis and measurements of near-fields interactions in a terahertz pulse near-field microscope. We developed a self-consistent line dipole image method for the quantitative analysis of the near-field interaction in THz scattering-type scanning optical microscopes. The measurements of approach curves and relative contrasts on gold and silicon substrates were in excellent agreement with calculations.

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