Open AccessQuantitative analysis and measurements of near-field interactions in terahertz microscopes
Author(s) -
Kiwon Moon,
Eun Jin Jung,
Moojong Lim,
Youngwoong Do,
Haewook Han
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.011539
Subject(s) - terahertz radiation , optics , microscope , near field scanning optical microscope , terahertz spectroscopy and technology , scattering , materials science , microscopy , optical microscope , near and far field , near field optics , physics , scanning electron microscope
We demonstrated quantitative analysis and measurements of near-fields interactions in a terahertz pulse near-field microscope. We developed a self-consistent line dipole image method for the quantitative analysis of the near-field interaction in THz scattering-type scanning optical microscopes. The measurements of approach curves and relative contrasts on gold and silicon substrates were in excellent agreement with calculations.