Limits of applicability of polarization sensitive reflectometry | Zendy

Luca Palmieri | Zendy; T. Geisler | Zendy; Andrea Galtarossa | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Limits of applicability of polarization sensitive reflectometry

Author(s) -

Luca Palmieri,

T. Geisler,

Andrea Galtarossa

Publication year - 2011

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.19.010874

Subject(s) - reflectometry , optics , polarization (electrochemistry) , image resolution , polarimeter , polarimetry , physics , materials science , computer science , time domain , chemistry , computer vision , scattering

We present a detailed theoretical analysis of the measurement limits of polarization sensitive reflectometry, imposed by spatial resolution and measurement accuracy. The limits are conveniently represented in a map of constraints. We also describe and experimentally verify a procedure that allows to measure spin profiles of single-mode fibers with spin rates exceeding the measurable range of the reflectometer. The technique consists in twisting the fiber to locally unwind the spin.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research