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Real-time terahertz material characterization by numerical three-dimensional optimization
Author(s) -
Maik Scheller
Publication year - 2011
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.010647
Subject(s) - terahertz radiation , optics , characterization (materials science) , terahertz spectroscopy and technology , dielectric , range (aeronautics) , time domain , computer science , algorithm , materials science , physics , optoelectronics , composite material , computer vision
Terahertz time domain spectroscopy allows for characterization of dielectrics even in cases where the samples thickness is unknown. However, a parameter extraction over a broad frequency range with simultaneous thickness determination is time consuming using conventional algorithms due to the large number of optimization steps. In this paper we present a novel method to extract the data. By employing a three dimensional optimization algorithm the calculation effort is significantly reduced while preserving the same accuracy level as conventional approaches. The presented method is even fast enough to be used in imaging applications.

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