Open AccessExperimental characterization of the coherence properties of hard x-ray sources
Author(s) -
Daniele Pelliccia,
Andrei Yurievich Nikulin,
H. O. Moser,
Keith A. Nugent
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.008073
Subject(s) - coherence (philosophical gambling strategy) , optics , degree of coherence , characterization (materials science) , physics , coherence theory , synchrotron , coherence time , ptychography , gaussian , coherence length , diffraction , laser , quantum mechanics , superconductivity
The experimental characterization of the coherence properties of hard X-ray sources is reported and discussed. The source is described by its Mutual Optical Intensity (MOI). The coherent-mode decomposition is applied to the MOI described by a Gaussian-Schell model. The method allows for a direct, quantitative characterization of the degree of coherence of both synchrotron and laboratory sources. The latter represents the first example of characterizing a low coherence hard x-ray source.