
Electric field enhancements around the nanorod on the base layer
Author(s) -
Zhongyue Zhang,
Zhidong Zhang,
Lijie Zhang,
Chengzhi Huang,
Zuhong Xiong
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.007274
Subject(s) - nanorod , materials science , electric field , optics , nanostructure , excitation , raman scattering , reflection (computer programming) , superposition principle , scattering , optoelectronics , raman spectroscopy , nanotechnology , physics , quantum mechanics , computer science , programming language
Electric field (E field) distributions of the silver rod-film nanostructures are calculated by the finite difference time domain method and compared with those of the individual nanorods. For the rod-film nanostructure, the incident waves are reflected back by the base layer and the superposition of the E fields of the incident wave and the reflection wave works as the excitation for the transverse mode electron oscillations in the nanorod, which results in the much enhanced E fields around the lateral surface of the nanorod. In addition, we investigate how the structural parameters of the rod-film nanostructure affect the E fields along the nanorod. These results would be much helpful for designing larger intensity surface enhanced Raman scattering substrates.