
Narrowband plasmonic excitation on gold hole-array nanostructures observed using spectroscopic ellipsometer
Author(s) -
G X Li,
Z L Wang,
S M Chen,
Kok Wai Cheah
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.006348
Subject(s) - ellipsometry , materials science , plasmon , optics , surface plasmon polariton , surface plasmon , rigorous coupled wave analysis , metamaterial , total internal reflection , optoelectronics , excitation , diffraction grating , physics , thin film , nanotechnology , grating , quantum mechanics
Surface plasmon polaritons (SPPs) modes on gold hole-array nanostructures were studied using spectroscopy ellipsometer in reflection mode. Using background free techniques in the optical ellipsometer, clear SPP bands on gold nanostructure/air interface were measured in UV-Visible-Near infrared (NIR) regime (300 nm-1800 nm). Plasmonic excitation with bandwidth of 13 nm (FWHM) was observed in reflection measurement, and it is much narrower than that observed in transmission measurement mode. In addition, the plasmonic excitation bands were characterized in both amplitude and phase domain. Theoretical analysis using reciprocal lattice vector method and rigorous coupled wave analysis (RCWA) agreed well with the experimental results. By measuring the TM and TE waves simultaneously, the spectroscopic ellipsometer provides an important method to analyze both amplitude and phase information in plasmonic nanostructures and metamaterials.