Open AccessBRDF profile of Tyvek and its implementation in the Geant4 simulation toolkit
Author(s) -
L. Nožka,
M. Pech,
Helena Hiklová,
D. Mandat,
M. Hrabovský,
P. Schovánek,
M. Palatka
Publication year - 2011
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.004199
Subject(s) - bidirectional reflectance distribution function , specular reflection , monte carlo method , scatterometer , optics , computer science , profilometer , remote sensing , reflectivity , physics , mathematics , surface roughness , geology , statistics , telecommunications , radar , quantum mechanics
Diffuse and specular characteristics of the Tyvek 1025-BL material are reported with respect to their implementation in the Geant4 Monte Carlo simulation toolkit. This toolkit incorporates the UNIFIED model. Coefficients defined by the UNIFIED model were calculated from the bidirectional reflectance distribution function (BRDF) profiles measured with a scatterometer for several angles of incidence. Results were amended with profile measurements made by a profilometer.