Extended depth-of-field microscopic imaging with a variable focus microscope objective | Zendy

Sheng Liu | Zendy; Hong Hua | Zendy

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Extended depth-of-field microscopic imaging with a variable focus microscope objective

Author(s) -

Sheng Liu,

Hong Hua

Publication year - 2010

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.19.000353

Subject(s) - microscope , optics , depth of field , focus (optics) , detector , optical microscope , depth of focus (tectonics) , field of view , image resolution , image processing , microscopy , materials science , point spread function , resolution (logic) , computer science , computer vision , physics , artificial intelligence , image (mathematics) , scanning electron microscope , subduction , biology , tectonics , paleontology

Increasing the depth-of-field (DOF) while maintaining high resolution imaging has been a classical challenge for conventional microscopes. Extended DOF (EDOF) is especially essential for imaging thick specimens. We present a microscope capable of capturing EDOF images in a single shot. A volumetric optical sampling method is applied by rapidly scanning the focus of a vari-focal microscope objective throughout the extended depths of a thick specimen within the duration of a single detector exposure. An EDOF image is reconstructed by deconvolving the captured image with the response function of the system. Design of a vari-focal objective and algorithms for restoring EDOF images are presented. Proof-of-concept experimental results demonstrate significantly extended DOF compared to the conventional microscope counterparts.

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