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Shot-noise limited detection for surface plasmon sensing
Author(s) -
Xi Wang,
Michael Jefferson,
Philip C. D. Hobbs,
W. P. Risk,
Bob E. Feller,
Robert D. Miller,
A. Knoesen
Publication year - 2010
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.19.000107
Subject(s) - optics , refractive index , surface plasmon , sensitivity (control systems) , noise (video) , materials science , shot noise , wavelength , plasmon , laser , refraction , light intensity , physics , detector , electronic engineering , artificial intelligence , computer science , image (mathematics) , engineering
It is demonstrated that surface plasmon sensing can be performed in the shot-noise-limited regime to resolve index of refractive changes on the order of 10 -10 /√Hz at input powers of 1 mW. This improved resolution is achieved by using active electronic noise cancelling to suppress laser intensity noise and a wavelength that maximizes sensitivity to index of refraction changes occurring at an interface. The resolution of the system is experimentally demonstrated by measuring the refractive index change of air in response to pressure changes.

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