Open AccessPolarization selective, graded-reflectivity resonance filter, using a space-varying guided-mode resonance structure
Author(s) -
Menelaos K. Poutous,
Aaron J. Pung,
Pratul P. Srinivasan,
Zachary Roth,
Eric Johnson
Publication year - 2010
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.027764
Subject(s) - optics , guided mode resonance , materials science , resonance (particle physics) , polarization (electrochemistry) , wavelength , optoelectronics , electron beam lithography , optical filter , aperture (computer memory) , rigorous coupled wave analysis , lithography , refractive index , diffraction , diffraction grating , physics , resist , chemistry , particle physics , layer (electronics) , acoustics , composite material
We designed, fabricated, and tested, polarization selective, graded-reflectivity resonant filters; based on a radial-gradient spatially-distributed, guided-mode resonance device architecture. The demonstrated filters have polarized spectral-resonance responses, distributed across their aperture extent, in the range between 1535 nm and 1540 nm wavelengths. Spectral sensitivity was observed on device tests, for wavelength changes as low as 0.2 nm. Using multiple lithographic exposures and biasing exposure methods, the devices were engineered to have a sub-aperture region, with no hard boundaries or diffraction anomalies.