Open AccessMeasurement of nonreciprocal spontaneous Raman scattering in Silicon photonic wires
Author(s) -
Johannes Müller,
Michael Krause,
Hagen Renner,
E. Brinkmeyer
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.019532
Subject(s) - raman scattering , optics , raman spectroscopy , materials science , silicon , raman amplification , scattering , orientation (vector space) , signal (programming language) , waveguide , photonics , photonic crystal , silicon photonics , optoelectronics , physics , geometry , mathematics , computer science , programming language
We report on measurements that show the strength of the spontaneous Raman scattering in strongly confining silicon waveguides to depend significantly on the propagation direction of the amplified signal wave with respect to the pump wave. Furthermore, the strength of this nonreciprocity depends on the orientation of the waveguide with respect to the crystallographic axes. We find that when changing the orientation from ˂011˃ to ˂001˃, the Raman-induced nonreciprocity increases by almost a factor of 3.