z-logo
open-access-imgOpen Access
Subwavelength film sensing based on terahertz anti-resonant reflecting hollow waveguides
Author(s) -
Borwen You,
Ja-Yu Lu,
Jia-Hong Liou,
Chin-Ping Yu,
Hao-Zai Chen,
Tze-An Liu,
Jin-Long Peng
Publication year - 2010
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.019353
Subject(s) - terahertz radiation , materials science , overlayer , optics , dielectric , tube (container) , refractive index , sensitivity (control systems) , terahertz spectroscopy and technology , optoelectronics , physics , electronic engineering , engineering , composite material , condensed matter physics
A simple dielectric hollow-tube has been experimentally demonstrated at terahertz range for bio-molecular layer sensing based on the anti-resonant reflecting wave-guidance mechanism. We experimentally study the dependence of thin-film detection sensitivity on the optical geometrical parameters of tubes, different thicknesses and tube wall refractive indices, and on different resonant frequencies. A polypropylene hollow-tube with optimized sensitivity of 0.003 mm/μm is used to sense a subwavelength-thick (λ/225) carboxypolymethylene molecular overlayer on the tube's inner surface, and the minimum detectable quantity of molecules could be down to 1.22 picomole/mm(2). A double-layered Fabry-Pérot model is proposed for calculating the overlayer thicknesses, which agrees well with the experimental results.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom