Subwavelength grating crossings for silicon wire waveguides | Zendy

Przemek J. Bock | Zendy; Pavel Cheben | Zendy; Jens H. Schmid | Zendy; J. Lapointe | Zendy; A. Delâge | Zendy; DanXia Xu | Zendy; Siegfried Janz | Zendy; A. Densmore | Zendy; Trevor J. Hall | Zendy

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Subwavelength grating crossings for silicon wire waveguides

Author(s) -

Przemek J. Bock,

Pavel Cheben,

Jens H. Schmid,

J. Lapointe,

A. Delâge,

DanXia Xu,

Siegfried Janz,

A. Densmore,

Trevor J. Hall

Publication year - 2010

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.18.016146

Subject(s) - optics , grating , polarization (electrochemistry) , materials science , silicon , crosstalk , waveguide , insertion loss , finite difference time domain method , diffraction grating , optoelectronics , physics , chemistry

We report on the design, simulation and experimental demonstration of a new type of waveguide crossing based on subwavelength gratings in silicon waveguides. We used 3D finite-difference time-domain simulations to minimize loss, crosstalk and polarization dependence. Measurement of fabricated devices show that our waveguide crossings have a loss as low as -0.023 dB/crossing, polarization dependent loss of < 0.02 dB and crosstalk <-40 dB.

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