Open AccessX-ray phase contrast microscopy at 300 nm resolution with laboratory sources
Author(s) -
Daniele Pelliccia,
Andrea Sorrentino,
Inna Bukreeva,
Alessia Cedola,
F. Scarinci,
Mihaela Ilie,
A. Gerardino,
Michela Fratini,
S. Lagomarsino
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.015998
Subject(s) - optics , phase contrast imaging , resolution (logic) , microscope , micrometer , microscopy , phase contrast microscopy , materials science , image resolution , contrast (vision) , phase (matter) , planar , optical microscope , physics , scanning electron microscope , computer science , computer graphics (images) , quantum mechanics , artificial intelligence
We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups.