X-ray phase contrast microscopy at 300 nm resolution with laboratory sources | Zendy

Daniele Pelliccia | Zendy; Andrea Sorrentino | Zendy; Inna Bukreeva | Zendy; Alessia Cedola | Zendy; F. Scarinci | Zendy; Mihaela Ilie | Zendy; Annamaria Gerardino | Zendy; Michela Fratini | Zendy; S. Lagomarsino | Zendy

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X-ray phase contrast microscopy at 300 nm resolution with laboratory sources

Author(s) -

Daniele Pelliccia,

Andrea Sorrentino,

Inna Bukreeva,

Alessia Cedola,

F. Scarinci,

Mihaela Ilie,

Annamaria Gerardino,

Michela Fratini,

S. Lagomarsino

Publication year - 2010

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.18.015998

Subject(s) - optics , phase contrast imaging , resolution (logic) , microscope , micrometer , microscopy , phase contrast microscopy , materials science , image resolution , contrast (vision) , phase (matter) , planar , optical microscope , physics , scanning electron microscope , computer science , computer graphics (images) , quantum mechanics , artificial intelligence

We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups.

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