Open AccessPhase-sensitive imaging of diffracted light by single nanoslits: measurements from near to far field
Author(s) -
H. W. Kihm,
Q. H. Kihm,
D. S. Kim,
Kwang Jun Ahn,
Ju Hyung Kang
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.015725
Subject(s) - optics , wavefront , interferometry , polarization (electrochemistry) , diffraction , orthogonal polarization spectral imaging , near and far field , physics , scattering , near field optics , phase (matter) , optical microscope , laser , scanning electron microscope , quantum mechanics , chemistry
We perform phase-sensitive imaging of optical wavefront emanating from a single nanoslit and propagating into free space by using scattering type near-field scanning optical microscope combined with an optical interferometer. By analyzing polarization resolved optical amplitudes and phases, the propagation directions of surface waves are determined and the phase difference between two orthogonal polarization components of the surface wave are discussed for increasing distance from the slit.