Open AccessSingle-shot picosecond interferometry with one-nanometer resolution for dynamical surface morphology using a soft X-ray laser
Author(s) -
Tohru Suemoto,
Kota Terakawa,
Yoshihiro Ochi,
Takuro Tomita,
Masakazu Yamamoto,
Noboru Hasegawa,
Manato Deki,
Yasuo Minami,
Tetsuya Kawachi
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.014114
Subject(s) - optics , interferometry , materials science , laser , picosecond , wavelength , image resolution , resolution (logic) , nanometre , nanoscopic scale , physics , nanotechnology , artificial intelligence , computer science
Using highly coherent radiation at a wavelength of 13.9 nm from a Ag-plasma soft X-ray laser, we constructed a pump-and-probe interferometer based on a double Lloyd's mirror system. The spatial resolutions are evaluated with a test pattern, showing 1.8-mum lateral resolution, and 1-nm depth sensitivity. This instrument enables a single-shot observation of the surface morphology with a 7-ps time-resolution. We succeeded in observing a nanometer scale surface dilation of Pt films at the early stage of the ablation process initiated by a 70 fs near infrared pump pulse.