Single-shot picosecond interferometry with one-nanometer resolution for dynamical surface morphology using a soft X-ray laser | Zendy

Tohru Suemoto | Zendy; Kota Terakawa | Zendy; Yoshihiro Ochi | Zendy; Takuro Tomita | Zendy; Minoru Yamamoto | Zendy; Noboru Hasegawa | Zendy; Manato Deki | Zendy; Yasuo Minami | Zendy; Tetsuya Kawachi | Zendy

Open Access

Single-shot picosecond interferometry with one-nanometer resolution for dynamical surface morphology using a soft X-ray laser

Author(s) -

Tohru Suemoto,

Kota Terakawa,

Yoshihiro Ochi,

Takuro Tomita,

Minoru Yamamoto,

Noboru Hasegawa,

Manato Deki,

Yasuo Minami,

Tetsuya Kawachi

Publication year - 2010

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.18.014114

Subject(s) - optics , interferometry , materials science , laser , picosecond , wavelength , image resolution , resolution (logic) , nanometre , nanoscopic scale , physics , nanotechnology , artificial intelligence , computer science

Using highly coherent radiation at a wavelength of 13.9 nm from a Ag-plasma soft X-ray laser, we constructed a pump-and-probe interferometer based on a double Lloyd's mirror system. The spatial resolutions are evaluated with a test pattern, showing 1.8-mum lateral resolution, and 1-nm depth sensitivity. This instrument enables a single-shot observation of the surface morphology with a 7-ps time-resolution. We succeeded in observing a nanometer scale surface dilation of Pt films at the early stage of the ablation process initiated by a 70 fs near infrared pump pulse.

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