Open AccessCell parameter measurement of a twisted nematic liquid crystal device using interferometric polarimeter under normal incidence
Author(s) -
Meng Han Liu,
Wen Chuan Kuo,
Hsiang Chun Wei,
Chien Chung Tsai,
Chih-Jen Yu,
Bau Jy Liang,
Chien Chou
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.008759
Subject(s) - optics , polarimeter , liquid crystal , materials science , rubbing , wavelength , interferometry , phase (matter) , polarimetry , physics , scattering , quantum mechanics , composite material
Five cell parameters of a twisted nematic liquid crystal device (TNLCD), namely, cell gap, pretilt angle, twisted angle, rubbing angle, and phase retardation are precisely measured by the developed amplitude-sensitive heterodyne polarimeter (ASHP) simultaneously integrated with Yeh and Gu's transfer matrix and Lien's transfer matrix. This proposed method can characterize the five cell parameters under the arrangement of a single wavelength at normal incidence. In contrast to the conventional methods on cell parameter detection either by adopting a multiple wavelength laser beam at normal incidence or by using a single wavelength laser beam under oblique incident to TNLCD, this method presents the advantage of not only having a simple setup but also the possibility to measure simultaneously five cell parameters on the characterization of TNLCD at high speed.