Open AccessRigorous modal analysis of silicon strip nanoscale waveguides
Author(s) -
D. M. H. Leung,
N. Kejalakshmy,
B. M. A. Rahman,
Kenneth T. V. Grattan
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.008528
Subject(s) - poynting vector , optics , birefringence , modal , silicon , modal analysis , finite element method , materials science , physics , optoelectronics , quantum mechanics , magnetic field , polymer chemistry , thermodynamics
A full-vectorial H-field Finite Element Method has been used for the rigorous modal analysis of silicon strip waveguides. The spatial variation of the full-vectorial H and E-fields are also discussed in details and further, the Poynting vector is also presented. The modal area, hybridness, single mode operation and birefringence are also described for such silicon strip waveguides.