Open AccessDiffraction-enhanced beam-focusing for X-rays in curved multi-plate crystal cavity
Author(s) -
Y.-Y. Chang,
Shuoyu Chen,
Huan Wu,
ShihChang Weng,
ChihPeng Chu,
Y.-R. Lee,
MauTsu Tang,
Yuri P. Stetsko,
BorYuan Shew,
Makina Yabashi,
ShihLin Chang
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.007886
Subject(s) - optics , diffraction , bragg's law , beam (structure) , materials science , crystal (programming language) , bent molecular geometry , reflection (computer programming) , silicon , diffraction topography , optoelectronics , physics , computer science , composite material , programming language
Unusual x-ray focusing effect is reported for parabolic curved multi-plate x-ray crystal cavities of silicon consisting of compound refractive lenses (CRL). The transmitted beam of the (12 4 0) back reflection near 14.4388 keV from these monolithic silicon crystal devices exhibits extraordinary focusing enhancement, such that the focal length is reduced by as much as 18% for 2-beam and 56% for 24-beam diffraction from the curved crystal cavity. This effect is attributed to the presence of the involved Bragg diffractions, in which the wavevector of the transmitted beam is bent further when traversing several curved crystal surfaces.