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Investigation on the role of the dielectric loss in metamaterial absorber
Author(s) -
Chenggang Hu,
Xiong Li,
Feng Qin,
Xu’Nan Chen,
Xiangang Luo
Publication year - 2010
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.18.006598
Subject(s) - metamaterial , dielectric , materials science , optics , dielectric loss , microwave , absorption (acoustics) , metamaterial absorber , electric field , optoelectronics , tunable metamaterials , physics , telecommunications , computer science , quantum mechanics
The authors report a metamaterial (MM) consisting of cut-wire structures which shows near-perfect absorption at microwave frequencies. Experimental results show slight lower performance than simulation. The analysis of the spectra and retrieved electromagnetic parameters demonstrate that the mismatch is attributed to the considerable influence of the dielectric loss on the strength of the electric and magnetic resonances, which largely determines the ability of the MM absorber. Such dependence on dielectric loss provides an important clue for the design of MM absorber aiming at specific applications where high efficiency energy collection in dielectric is needed.

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