Open AccessThe characterization of GH shifts of surface plasmon resonance in a waveguide using the FDTD method
Author(s) -
Geum-Yoon Oh,
Doo Gun Kim,
YoungWan Choi
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.020714
Subject(s) - finite difference time domain method , surface plasmon resonance , optics , waveguide , resonance (particle physics) , surface plasmon , wavelength , materials science , plasmon , phase (matter) , total internal reflection , guided mode resonance , physics , atomic physics , nanotechnology , quantum mechanics , nanoparticle , diffraction grating
We have explicated the Goos-Hänchen (GH) shift in a mum-order Kretchmann-Raether configuration embedded in an optical waveguide structure by using the finite-difference time-domain method. For optical waveguide-type surface plasmon resonance (SPR) devices, the precise derivation of the GH shift has become critical. Artmann's equation, which is accurate enough for bulk optics, is difficult to apply to waveguide-type SPR devices. This is because Artmann's equation, based on the differentiation of the phase shift, is inaccurate at the critical and resonance angles where drastic phase changes occur. In this study, we accurately identified both the positive and the negative GH shifts around the incidence angle of resonance. In a waveguide-type Kretchmann-Raether configuration with an Au thin film of 50 nm, positive and negative lateral shifts of -0.75 and + 1.0 microm are obtained on the SPR with the incident angles of 44.4 degrees and 47.5 degrees, respectively, at a wavelength of 632.8 nm.