Open AccessLine-defect calibration for line-scanning projection display
Author(s) -
Sung Yong An,
Jay Hyok Song,
Anatoliy Lapchuk,
Victor Yurlov,
Seung-Won Ryu,
Eung-ju Kim,
Sang Kyeong Yun
Publication year - 2009
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.016492
Subject(s) - optics , line (geometry) , calibration , crosstalk , computer science , projection (relational algebra) , pixel , computer vision , physics , algorithm , geometry , mathematics , quantum mechanics
A method of line-defect calibration for line-scanning projection display is developed to accomplish acceptable display uniformity. The line scanning display uses a line modulating imaging and scanning device to construct a two-dimensional image. The inherent line-defects in an imaging device and optical lenses are the most fatal performance-degrading factor that should be overcome to reach the basic display uniformity level. Since the human eye recognizes line defects very easily, a method that perfectly removes line defects is required. Most line imaging devices are diffractive optical devices that require a coherent light source. This particular requirement makes the calibration method of sequential single pixel measurement and correction insufficient to take out the line defects distributed on screen due to optical crosstalk. In this report, we present a calibration method using a recursively converging algorithm that successfully transforms the unacceptable line-defected images into a uniform display image.