
Measurement of helical twisting power based on axially symmetrical photo-aligned dye-doped liquid crystal film
Author(s) -
Shih-Wei Ko,
ShuChien Huang,
Andy Ying–Guey Fuh,
TsungHsien Lin
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.015926
Subject(s) - disclination , axial symmetry , materials science , optics , liquid crystal , doping , rotation (mathematics) , twist , crystal (programming language) , optoelectronics , physics , geometry , mathematics , quantum mechanics , computer science , programming language
This investigation demonstrates a simple but accurate method for measuring the helical twisting power of chiral doped liquid crystals using axially symmetrical photo-alignment in azo dye-doped liquid crystal films. As reported in our previous paper, a reversed twist effect produces a disclination line in photo-aligned axially symmetrical liquid crystal films. The pitch and helical twisting power can be obtained by measuring the rotation angle of the disclination line in chrial doped liquid crystal. This method is independent of cell gap and provide an error below 0.5%.