Open AccessHybrid integration of Ca_028Ba_072Nb_2O_6 thin film electro-optic waveguides with silica/silicon substrates
Author(s) -
Paul F. Ndione,
Marcello Ferrera,
D. Duchesne,
Luca Razzari,
Mounir Gaidi,
Mohamed Chaker,
Roberto Morandotti
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.015128
Subject(s) - materials science , optics , thin film , wavelength , diffraction , silicon , refractive index , reflection (computer programming) , waveguide , reflection coefficient , total internal reflection , optoelectronics , nanotechnology , physics , computer science , programming language
Ca(0.28)Ba(0.72)Nb(2)O(6) (CBN-28) waveguides based on thin film technology were fabricated on SiO(2)/(100) Si substrates. By using X-ray diffraction, we confirmed the preferential c-axis orientation of the CBN structures. An effective unclamped electro-optic r33 coefficient of 12 pm/V was measured in CBN thin films by using an ellipsometric technique in reflection geometry. In addition, by means of a Fabry-Perot technique, the propagation losses of our strip loaded waveguides were estimated to be as low as 4.8 dB/cm and 6.5 dB/cm at telecommunication wavelengths for the fundamental TE and TM modes, respectively.