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Speckle-field digital holographic microscopy
Author(s) -
Yong Keun Park,
Wonshik Choi,
Zahid Yaqoob,
Ramachandra R. Dasari,
Kamran Badizadegan,
Michael S. Feld
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.012285
Subject(s) - optics , digital holographic microscopy , holography , speckle pattern , microscopy , optical sectioning , digital holography , light sheet fluorescence microscopy , lens (geology) , materials science , speckle noise , image resolution , depth of field , phase contrast imaging , spatial frequency , scanning confocal electron microscopy , phase contrast microscopy , physics
The use of coherent light in conventional holographic phase microscopy (HPM) poses three major drawbacks: poor spatial resolution, weak depth sectioning, and fixed pattern noise due to unwanted diffraction. Here, we report a technique which can overcome these drawbacks, but maintains the advantage of phase microscopy - high contrast live cell imaging and 3D imaging. A speckle beam of a complex spatial pattern is used for illumination to reduce fixed pattern noise and to improve optical sectioning capability. By recording of the electric field of speckle, we demonstrate high contrast 3D live cell imaging without the need for axial scanning - neither objective lens nor sample stage. This technique has great potential in studying biological samples with improved sensitivity, resolution and optical sectioning capability.

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