Open AccessPolarization dependence of Z-scan measurement: theory and experiment
Author(s) -
XiaoQing Yan,
Zhibo Liu,
Xiaoliang Zhang,
Wenyuan Zhou
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.006397
Subject(s) - elliptical polarization , optics , z scan technique , physics , polarization (electrochemistry) , transmittance , isotropy , circular polarization , anisotropy , light beam , nonlinear system , linear polarization , nonlinear optics , quantum mechanics , chemistry , laser , microstrip
Here we report on an extension of common Z-scan method to arbitrary polarized incidence light for measurements of anisotropic third-order nonlinear susceptibility in isotropic medium. The normalized transmittance formulas of closed-aperture Z-scan are obtained for linearly, elliptically and circularly polarized incidence beam. The theoretical analysis is examined experimentally by studying third-order nonlinear susceptibility of CS2 liquid. Results show that the elliptically polarized light Z-scan method can be used to measure simultaneously the two third-order nonlinear susceptibility components chi(3)(xyyx) and chi(3)(xxyy). Furthermore, the elliptically polarized light Z-scan measurements of large nonlinear phase shift are also analyzed theoretically and experimentally.