Improved sample characterization in terahertz reflection imaging and spectroscopy | Zendy

Sheng-Yang Huang | Zendy; Philip C. Ashworth | Zendy; Kanis Wai Chi Kan | Zendy; Yang Chen | Zendy; Vincent P. Wallace | Zendy; YuanTing Zhang | Zendy; Emma PickwellMacPherson | Zendy

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Improved sample characterization in terahertz reflection imaging and spectroscopy

Author(s) -

Sheng-Yang Huang,

Philip C. Ashworth,

Kanis Wai Chi Kan,

Yang Chen,

Vincent P. Wallace,

YuanTing Zhang,

Emma PickwellMacPherson

Publication year - 2009

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.17.003848

Subject(s) - terahertz radiation , optics , terahertz spectroscopy and technology , reflection (computer programming) , sample (material) , attenuation , characterization (materials science) , materials science , window (computing) , total internal reflection , spectroscopy , reflection coefficient , medical imaging , fresnel equations , refractive index , physics , computer science , quantum mechanics , thermodynamics , programming language , operating system , artificial intelligence

For imaging applications involving biological subjects, the strong attenuation of terahertz radiation by water means that terahertz pulsed imaging is most likely to be successfully implemented in a reflection geometry. Many terahertz reflection geometry systems have a window onto which the sample is placed - this window may introduce unwanted reflections which interfere with the reflection of interest from the sample. In this paper we derive a new approach to account for the effects of these reflections and illustrate its success with improved calculations of sample optical properties.

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