Open AccessAnalysis and experimental assessment of the sensitivity of stimulated Raman scattering microscopy
Author(s) -
Yasuyuki Ozeki,
Fumihiro Dake,
Shin’ichiro Kajiyama,
Kiichi Fukui,
Kazuyoshi Itoh
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.003651
Subject(s) - raman scattering , microscopy , optics , raman spectroscopy , materials science , microscope , sensitivity (control systems) , coherent anti stokes raman spectroscopy , optical microscope , scattering , x ray raman scattering , physics , scanning electron microscope , electronic engineering , engineering
We theoretically show that the shot-noise-limited sensitivity of stimulated Raman scattering (SRS) microscopy, which enables high-contrast vibrational imaging, is similar to that of coherent anti-Stokes Raman scattering microscopy. We experimentally confirm that the sensitivity of our SRS microscope is lower than the shot-noise limit only by <15 dB, which indicates that the high-sensitivity of SRS microscopy is readily available.