Open AccessInvestigation of the influence of the aberration induced by a plane interface on STED microscopy
Author(s) -
Suhui Deng,
Li Liu,
Ya Cheng,
Ruxin Li,
Zhizhan Xu
Publication year - 2009
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.17.001714
Subject(s) - sted microscopy , optics , microscopy , stimulated emission , gaussian beam , beam (structure) , interference microscopy , materials science , physics , laser
The structure of the inhibition patterns is important to the stimulated emission depletion (STED) microscopy. Usually, Laguerre- Gaussian (LG) beam and the central zero-intensity patterns created by inserting phase masks in Gaussian beams are used as the erase beam in STED microscopy. Aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. By use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the STED microscopy are studied. Results are presented as a comparison between the aberration-free case and the aberrated cases.