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Multiple reflection Michelson interferometer with picometer resolution
Author(s) -
Marco Pisani
Publication year - 2008
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.021558
Subject(s) - optics , interferometry , michelson interferometer , nanometrology , physics , reflection (computer programming) , astronomical interferometer , optical path length , metrology , computer science , programming language
A Michelson interferometer based on an optical set-up allowing multiple reflection between two plane mirrors performs the multiplication of the optical path by a factor N, proportionally increasing the resolution of the measurement. A multiplication factor of almost two orders of magnitude has been demonstrated with a simple set-up. The technique can be applied to any interferometric measurement where the classical interferometer limits due to fringe nonlinearities and quantum noise are an issue. Applications in precision engineering, vibration analysis, nanometrology, and spectroscopy are foreseen.

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