
Mueller matrix retinal imager with optimized polarization conditions
Author(s) -
Karen Twietmeyer,
Russell A. Chipman,
Ann E. Elsner,
Yanming Zhao,
Dean A. VanNasdale
Publication year - 2008
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.021339
Subject(s) - mueller calculus , optics , polarimetry , polarimeter , polarization (electrochemistry) , beam splitter , materials science , physics , birefringence , repeatability , laser , scattering , mathematics , chemistry , statistics
A new Mueller matrix polarimeter was used to image the retinas of normal subjects. Light from a linearly polarized 780 nm laser was passed through a system of variable retarders and scanned across the retina. Light returned from the eye passed through a second system of retarders and a polarizing beamsplitter to two confocal detection channels. Optimization of the polarimetric data reduction matrix was via a condition number metric. The accuracy and repeatability of polarization parameter measurements were within +/- 5%. The magnitudes and orientations of retardance and diattenuation, plus depolarization, were measured over 15 degrees of retina for 15 normal eyes.