Near- to far-field imaging of phase evolution of light emanating from a metal nanoslit | Zendy

Yun Suk Jung | Zendy; Yonggang Xi | Zendy; Jeff Wuenschell | Zendy; Hong Koo Kim | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Near- to far-field imaging of phase evolution of light emanating from a metal nanoslit

Author(s) -

Yun Suk Jung,

Yonggang Xi,

Jeff Wuenschell,

Hong Koo Kim

Publication year - 2008

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.16.018881

Subject(s) - optics , near and far field , wavefront , diffraction , surface plasmon , phase (matter) , materials science , interference (communication) , plasmon , near field optics , extraordinary optical transmission , surface plasmon polariton , physics , optical microscope , scanning electron microscope , channel (broadcasting) , electrical engineering , quantum mechanics , engineering

We report near- to far-field measurement of optical wavefronts emanating from a nanoslit formed in a thin (50 nm thick) Ag film. The evolution of optical phases is imaged using a self-interference technique in conjunction with a scanning probe method. The phase relationship of the slit-transmitted waves with respect to the direct transmission through the thin metal film is quantitatively established. The singular-phase points resulting from the interplay of slit diffraction and surface plasmons are identified in the intermediate-field region.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research