Measurement of pump-induced transient lensing in a cryogenically-cooled high average power Ti:sapphire amplifier | Zendy

Thomas A. Planchon | Zendy; Wafa Amir | Zendy; Colby Childress | Zendy; Jeff Squier | Zendy; Charles G. Durfee | Zendy

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Measurement of pump-induced transient lensing in a cryogenically-cooled high average power Ti:sapphire amplifier

Author(s) -

Thomas A. Planchon,

Wafa Amir,

Colby Childress,

Jeff Squier,

Charles G. Durfee

Publication year - 2008

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.16.018557

Subject(s) - optics , amplifier , materials science , interferometry , sapphire , transient (computer programming) , thermal , laser , physics , optoelectronics , cmos , meteorology , computer science , operating system

The transient thermal lensing in a liquid-nitrogren cooled kilohertz multipass amplifier is quantitatively measured with spatially-resolved Fourier transform spectral interferometry. A pump-probe arrangement allows the observation of a polarization-dependent non-thermal component following the fluorescence timescale: additional cooling would not suppress this residual lensing. We also observe a time-dependent thermal component that has a timescale sufficiently fast to indicate that there is cooling between shots even at a repetition rate of 1 kHz. The value of pump-induced lensing would be underestimated when performing time-averaged measurements of pump-induced phase shifts.

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