Open AccessFourier fluorescence spectrometer for excitation emission matrix measurement
Author(s) -
Leilei Peng,
Joseph A. Gardecki,
Brett E. Bouma,
Guillermo J. Tearney
Publication year - 2008
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.010493
Subject(s) - michelson interferometer , optics , interferometry , spectrometer , spectral resolution , fourier transform spectroscopy , fluorometer , fourier transform , physics , fluorescence , materials science , fourier transform infrared spectroscopy , spectral line , quantum mechanics , astronomy
We demonstrate a fluorescence spectrometer that utilizes principles of Fourier transform spectroscopy to measure excitation emission matrices (EEM) rapidly and with high spectral resolution. For this EEM fluorometer, incoherent excitation light is first input into a differential-delay scanning Michelson interferometer. Light from the output port excites sample fluorescence. The fluorescence remitted from the sample is directed to a second Michelson interferometer, whose differential-delay scanning is synchronized with the first interferometer. The EEM is obtained by two-dimensional Fourier analysis of the detected signal from the output port of the second interferometer. EEM results from the system are verified by comparing with results from a standard spectrometer. The system provides a wide spectral range, adjustable spectral resolution, and fast EEM acquisition speed, which allows EEM's to be acquired in 40 seconds at a spectral resolution of 81-cm-1.