Open AccessDual wavelengths monitoring for optical coatings
Author(s) -
Fachun Lai,
Xian Wu,
Binping Zhuang,
Yan Qu,
Zhigao Huang
Publication year - 2008
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.009436
Subject(s) - optics , wavelength , materials science , coating , layer (electronics) , admittance , figuring , sensitivity (control systems) , optical coating , optoelectronics , electronic engineering , physics , nanotechnology , electrical impedance , engineering , quantum mechanics
A new monitoring method based on the use of dual wavelengths monitoring is proposed. Firstly, the sensitivity of each layer in an optical coating for the monitoring wavelength is calculated by admittance equations. Then two appropriate monitoring wavelengths are chosen to make sure that every layer has a sensitive terminal point. The thickness error of the layer can be compensated. For quarter-wave multilayer and nonquarter-wave multilayer optical coatings, the advantage of this new monitoring method has been demonstrated by both the theoretical analyses and experimental results.