Nanoscale depth resolution in scanning near-field infrared microscopy | Zendy

Götz Wollny | Zendy; Erik Bründermann | Zendy; Zoran Arsov | Zendy; Luca Quaroni | Zendy; Martina Havenith | Zendy

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Nanoscale depth resolution in scanning near-field infrared microscopy

Author(s) -

Götz Wollny,

Erik Bründermann,

Zoran Arsov,

Luca Quaroni,

Martina Havenith

Publication year - 2008

Publication title -

optics express

Language(s) - Slovenian

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.16.007453

Subject(s) - nanoscopic scale , mica , materials science , optics , resolution (logic) , near field scanning optical microscope , infrared , infrared microscopy , silicon , microscopy , image resolution , optical microscope , optoelectronics , scanning electron microscope , nanotechnology , physics , artificial intelligence , computer science , composite material

We have recorded nanoscale topography and infrared chemical fingerprints of attomole layered lipids consisting of dimyristoylpho-sphatidylcholine on silicon and mica. Lipids deposited on mica built stacks consisting of up to 25 bilayers, each approximately 5 nm thick, spanning a range from 5-125 nm in height. Contrast evaluation as a function of layer thickness provides the near-field depth resolution.

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