Open AccessNanoscale depth resolution in scanning near-field infrared microscopy
Author(s) -
Götz Wollny,
Erik Bründermann,
Zoran Arsov,
Luca Quaroni,
Martina Havenith
Publication year - 2008
Publication title -
optics express
Language(s) - Slovenian
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.16.007453
Subject(s) - nanoscopic scale , mica , materials science , optics , resolution (logic) , near field scanning optical microscope , infrared , infrared microscopy , silicon , microscopy , image resolution , optical microscope , optoelectronics , scanning electron microscope , nanotechnology , physics , artificial intelligence , computer science , composite material
We have recorded nanoscale topography and infrared chemical fingerprints of attomole layered lipids consisting of dimyristoylpho-sphatidylcholine on silicon and mica. Lipids deposited on mica built stacks consisting of up to 25 bilayers, each approximately 5 nm thick, spanning a range from 5-125 nm in height. Contrast evaluation as a function of layer thickness provides the near-field depth resolution.